APA Citation

Tan, S. (2018). A self-adaptive class-imbalance TSK neural network with applications to semiconductor defects detection. Elsevier Inc.

Chicago Style Citation

Tan, S.C. A Self-adaptive Class-imbalance TSK Neural Network With Applications to Semiconductor Defects Detection. Elsevier Inc, 2018.

MLA Citation

Tan, S.C. A Self-adaptive Class-imbalance TSK Neural Network With Applications to Semiconductor Defects Detection. Elsevier Inc, 2018.

Warning: These citations may not always be 100% accurate.