APA Citation

Krishnamurthy, S. (2020). Simulation study of single event burnout hardening technique on power UMOSFET using P-Island layer. Institute of Electrical and Electronics Engineers Inc.

Chicago Style Citation

Krishnamurthy, S. Simulation Study of Single Event Burnout Hardening Technique On Power UMOSFET Using P-Island Layer. Institute of Electrical and Electronics Engineers Inc, 2020.

MLA Citation

Krishnamurthy, S. Simulation Study of Single Event Burnout Hardening Technique On Power UMOSFET Using P-Island Layer. Institute of Electrical and Electronics Engineers Inc, 2020.

Warning: These citations may not always be 100% accurate.