Lim, L. (2020). A study on fNIRS-based working memory load assessment and potential issues with extracerebral artifacts. Institute of Electrical and Electronics Engineers Inc.
Chicago Style CitationLim, L.G. A Study On FNIRS-based Working Memory Load Assessment and Potential Issues With Extracerebral Artifacts. Institute of Electrical and Electronics Engineers Inc, 2020.
MLA CitationLim, L.G. A Study On FNIRS-based Working Memory Load Assessment and Potential Issues With Extracerebral Artifacts. Institute of Electrical and Electronics Engineers Inc, 2020.
Warning: These citations may not always be 100% accurate.