Beheshti, M. (2016). Design and implementation of scanning electrochemical microscopy (SECM) for scanning open circuit potential system on damaged coated surfaces. Asian Research Publishing Network.
Chicago Style CitationBeheshti, M. Design and Implementation of Scanning Electrochemical Microscopy (SECM) for Scanning Open Circuit Potential System On Damaged Coated Surfaces. Asian Research Publishing Network, 2016.
MLA CitationBeheshti, M. Design and Implementation of Scanning Electrochemical Microscopy (SECM) for Scanning Open Circuit Potential System On Damaged Coated Surfaces. Asian Research Publishing Network, 2016.
Warning: These citations may not always be 100% accurate.