Mohammadat, M. (2015). Resistive open faults detectability analysis and implications for testing low power nanometric ICs. Institute of Electrical and Electronics Engineers Inc.
Chicago Style CitationMohammadat, M.T. Resistive Open Faults Detectability Analysis and Implications for Testing Low Power Nanometric ICs. Institute of Electrical and Electronics Engineers Inc, 2015.
MLA CitationMohammadat, M.T. Resistive Open Faults Detectability Analysis and Implications for Testing Low Power Nanometric ICs. Institute of Electrical and Electronics Engineers Inc, 2015.
Warning: These citations may not always be 100% accurate.