Ghai, L. (2014). Automatic assessment mark entry system using local binary pattern (LBP) and salient structural features. Institute of Electrical and Electronics Engineers Inc.
Chicago Style CitationGhai, L.L. Automatic Assessment Mark Entry System Using Local Binary Pattern (LBP) and Salient Structural Features. Institute of Electrical and Electronics Engineers Inc, 2014.
MLA CitationGhai, L.L. Automatic Assessment Mark Entry System Using Local Binary Pattern (LBP) and Salient Structural Features. Institute of Electrical and Electronics Engineers Inc, 2014.
Warning: These citations may not always be 100% accurate.