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Noohul Basheer
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1
Crack Fault Modeling for Cantilever-based MEMS Sensor /
by
Muhammad Shoaib
,
Nor Hisham
,
Noohul Basheer
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2
Feasibility Investigation of Fault Diagnosis by Time-Spatial Electromagnetic Analysis of Nano Scale Integrated Circuits /
by
Soeung Socheatra
,
Noohul Basheer
Zain Ali
,
Ellis, Grant Andrew
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3
Oscillation Based Testing Methodology for MEDA Based Digital Microfluidics Biochips /
by
Vineeta Shukla
,
Fawnizu Azmadi Hussin
,
Nor Hisham Hamid
,
Noohul Basheer
Zain Ali
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Related Subjects
Electrical engineering
Biochips
Cantilevers
Electronic engineering
Microfluidics
Semiconductor industry