检索结果 - Noohul Basheer

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    Crack Fault Modeling for Cantilever-based MEMS Sensor / 由 Muhammad Shoaib, Nor Hisham, Noohul Basheer

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    Feasibility Investigation of Fault Diagnosis by Time-Spatial Electromagnetic Analysis of Nano Scale Integrated Circuits / 由 Soeung Socheatra, Noohul Basheer Zain Ali, Ellis, Grant Andrew

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    Oscillation Based Testing Methodology for MEDA Based Digital Microfluidics Biochips / 由 Vineeta Shukla, Fawnizu Azmadi Hussin, Nor Hisham Hamid, Noohul Basheer Zain Ali

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