Modified short-run statistical process control for test and measurement process
The key characteristics of test and measurement (T&M) manufacturing are short-run, multi-product families and testing at multi-stations. These characteristics render statistical process control (SPC) inefficacious because inherently meagre data do not warrant meaningful control limits. Measureme...
| Main Authors: | Koh, C.K., Chin, J.F., Kamaruddin, S. |
|---|---|
| Format: | Article |
| Institution: | Universiti Teknologi Petronas |
| Record Id / ISBN-0: | utp-eprints.22139 / |
| Published: |
2019
|
| Online Access: |
https://www.scopus.com/inward/record.uri?eid=2-s2.0-85054607120&doi=10.1007%2fs00170-018-2776-1&partnerID=40&md5=295bffc954d2e830a677f795d757f7d5 http://eprints.utp.edu.my/22139/ |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|