A Review on Key Issues and Challenges in Devices Level MEMS Testing
| Main Authors: | Shoaib, M., Hamid, N.H., Malik, A.F., Zain Ali, N.B., Tariq Jan, M. |
|---|---|
| Format: | Article |
| Institution: | Universiti Teknologi Petronas |
| Record Id / ISBN-0: | utp-eprints.24250 / |
| Published: |
Hindawi Limited
2016
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| Online Access: |
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84960977862&doi=10.1155%2f2016%2f1639805&partnerID=40&md5=ff7593e8cb5ee61cbd744792bdb0bd35 http://eprints.utp.edu.my/24250/ |
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