Enhanced Trench Shielded Power UMOSFET for Single Event Burnout Hardening

Main Authors: Krishnamurthy, S., Kannan, R., Hussin, F.A., Yahya, E.A.
Format: Conference or Workshop Item
Institution: Universiti Teknologi Petronas
Record Id / ISBN-0: utp-eprints.24992 /
Published: Institute of Electrical and Electronics Engineers Inc. 2019
Online Access: https://www.scopus.com/inward/record.uri?eid=2-s2.0-85078311992&doi=10.1109%2fRSM46715.2019.8943495&partnerID=40&md5=7c8ac635c0f811653efb271a9f089524
http://eprints.utp.edu.my/24992/
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