Abnormality Detection and Failure Prediction Using Explainable Bayesian Deep Learning: Methodology and Case Study with Industrial Data

Main Authors: Nor, A.K.M., Pedapati, S.R., Muhammad, M., Leiva, V.
Format: Article
Institution: Universiti Teknologi Petronas
Record Id / ISBN-0: utp-eprints.28669 /
Published: MDPI 2022
Online Access: https://www.scopus.com/inward/record.uri?eid=2-s2.0-85124729775&doi=10.3390%2fmath10040554&partnerID=40&md5=a1656ffe9430765b994ee7e07163c7ff
http://eprints.utp.edu.my/28669/
Tags: Add Tag
No Tags, Be the first to tag this record!
Be the first to leave a comment!