Enhancement in IEEE 1500 standard for at-speed functional testing
System on chip (SOC) makes it possible to design a complex system in a short period of time by using intellectual property (IP) blocks. The complexity of the design makes testing of the SOC a very difficult task. To alleviate this test access issue, IEEE 1500 has been introduced. It has become a wid...
| Main Authors: | Ali, G., Hussin, F.A., Ali, N.B.Z., Hamid, N.H. |
|---|---|
| Format: | Conference or Workshop Item |
| Institution: | Universiti Teknologi Petronas |
| Record Id / ISBN-0: | utp-eprints.32165 / |
| Published: |
IEEE Computer Society
2014
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| Online Access: |
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84906330413&doi=10.1109%2fICIAS.2014.6869507&partnerID=40&md5=39e077f6adb39c7c458f2069ea8770df http://eprints.utp.edu.my/32165/ |
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