Skip to content
UTP PerakGateway
Information Resource Centre
Login
Theme
Bootstrap
Perak
Language
English
中文(简体)
اللغة العربية
தமிழ்
All Fields
Title
Author
Subject
Call Number
ISBN/ISSN
Tag
Find
Advanced
Advances in low atomic number...
Cite this
Text this
Email this
Print
Export Record
Export to RefWorks
Export to EndNoteWeb
Export to EndNote
Save to List
Permanent link
Advances in low atomic number element analysis by wavelength dispersive x-ray fluorescence spectrometry /
Saved in:
Bibliographic Details
Main Author:
Vrebos, Bruno
Format:
Article
Language:
English
Tags:
Add Tag
No Tags, Be the first to tag this record!
Holdings
Description
Comments
Similar Items
Staff View
Description
ISBN:
9839700405 (pbk.) :
Similar Items
Real-time digital x-ray radioscopic inspection system
by: M.H. Ahmad Fadzil
Investigation of x-ray energy for computed tomography using film technique /
by: Somyot Srisatit
The comparison of neutron, gamma and x-ray radiography images for materials evaluation /
Residual stress characterization of welds using x-ray diffraction techniques /
by: Pineault, James A.
Mechanical characterisation of surface layers by x-ray diffraction - application to tribology /
by: Farrahi, G.H