记录引文
APA引文
Soeung Socheatra, Noohul Basheer Zain Ali, & Ellis, G. A. Feasibility Investigation of Fault Diagnosis by Time-Spatial Electromagnetic Analysis of Nano Scale Integrated Circuits.
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芝加哥风格引文
Soeung Socheatra, Noohul Basheer Zain Ali, 与 Grant Andrew Ellis. Feasibility Investigation of Fault Diagnosis by Time-Spatial Electromagnetic Analysis of Nano Scale Integrated Circuits.
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MLA引文
Soeung Socheatra, et al. Feasibility Investigation of Fault Diagnosis by Time-Spatial Electromagnetic Analysis of Nano Scale Integrated Circuits.
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