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Feasibility Investigation of Fault Diagnosis by Time-Spatial Electromagnetic Analysis of Nano Scale Integrated Circuits /

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Main Authors: Soeung Socheatra (Author), Noohul Basheer Zain Ali (Author), Ellis, Grant Andrew (Author)
Format: Article
Language:English
Subjects:
Electrical engineering
Electronic engineering
Semiconductor industry
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Bibliography:Bibliography: pages [4-5]
ISBN:9789832271888

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