Advances in low atomic number element analysis by wavelength dispersive x-ray fluorescence spectrometry /
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| التنسيق: | مقال |
| اللغة: | الإنجليزية |
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مواد مشابهة: Advances in low atomic number element analysis by wavelength dispersive x-ray fluorescence spectrometry /
- Real-time digital x-ray radioscopic inspection system
- Investigation of x-ray energy for computed tomography using film technique /
- The comparison of neutron, gamma and x-ray radiography images for materials evaluation /
- Residual stress characterization of welds using x-ray diffraction techniques /
- Mechanical characterisation of surface layers by x-ray diffraction - application to tribology /
- X-ray crystallographic studies at school of physics, Universiti Sains Malaysia /