Performance analysis of Arithmetic Mean method in determining peak junction temperature of semiconductor device
High reliability users of microelectronic devices have been derating junction temperature and other critical stress parameters to improve device reliability and extend operating life. The reliability of a semiconductor is determined by junction temperature. This paper gives a useful analysis on math...
| Main Authors: | Muthuvalu, M.S., Asirvadam, V.S., Mashadov, G. |
|---|---|
| Format: | Article |
| Institution: | Universiti Teknologi Petronas |
| Record Id / ISBN-0: | utp-eprints.26321 / |
| Published: |
Ain Shams University
2015
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| Online Access: |
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84959573705&doi=10.1016%2fj.asej.2015.04.007&partnerID=40&md5=470d9370541546c69be91fcaf46fd6ee http://eprints.utp.edu.my/26321/ |
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